FIELD-EMISSION GUNS FOR ELECTRON-PROBE INSTRUMENTS

[11] A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) : 5861 - &

[12] DEKKER AJ, 1958, SOLID STATE PHYS

[13] DRECHSLER M, 1958, 4 P INT C EL MICR BE, P13

[14] Dyke W P, 1956, ADV ELECT ELECTRON P, V8, P89

[15] ELECTRICAL STABILITY AND LIFE OF THE HEATED FIELD EMISSION CATHODE [J]. JOURNAL OF APPLIED PHYSICS, 1960, 31 (05) : 790 - 805

[16] SIMPLIFIED ANALYSIS OF POINT-CATHODE ELECTRON SOURCES [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (13) : 4944 - &

[17] Electron emission in intense electric fields [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1928, 119 (781) : 173 - 181

[18] Gomer R., 1961, FIELD EMISSION FIELD

[19] Good RH., 1956, FIELD EMISSION, P176

[20] GRIVET P, 1972, ELECTRON OPTICS

[11] A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) : 5861 - &

[12] DEKKER AJ, 1958, SOLID STATE PHYS

[13] DRECHSLER M, 1958, 4 P INT C EL MICR BE, P13

[14] Dyke W P, 1956, ADV ELECT ELECTRON P, V8, P89

[15] ELECTRICAL STABILITY AND LIFE OF THE HEATED FIELD EMISSION CATHODE [J]. JOURNAL OF APPLIED PHYSICS, 1960, 31 (05) : 790 - 805

[16] SIMPLIFIED ANALYSIS OF POINT-CATHODE ELECTRON SOURCES [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (13) : 4944 - &

[17] Electron emission in intense electric fields [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1928, 119 (781) : 173 - 181

[18] Gomer R., 1961, FIELD EMISSION FIELD

[19] Good RH., 1956, FIELD EMISSION, P176

[20] GRIVET P, 1972, ELECTRON OPTICS