SOME DEVICE APPLICATIONS OF SPREADING RESISTANCE MEASUREMENTS ON EPITAXIAL SILICON

[1] AGRAZGUERENA J, 1972, DEC INT EL DEV M WAS

[2] COPELAND JA, 1969, IEEE T ELECTRON DEVI, VED16, P445

[3] GARDNER EE, 1967, MEASUREMENT TECHNIQU

[4] Grove A. S., 1967, Physics and Technology of Semiconductor Devices

[5] GUPTA DC, 1970, REV SCI INSTRUM, V41, P1681, DOI 10.1063/1.1684463

[6] HOLM R, 1967, ELECTRIC CONTACTS HD

[7] LANGER PH, 1972, OCT MIAM BEACH M SOC

[8] MILLER GL, 1972, IEEE T ELECTRON DEVI, VED19, P1103

[9] COLLECTOR DIFFUSION ISOLATED INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE IEEE, 1969, 57 (09) : 1523 - +

[10] SPREADING RESISTANCE CORRECTION FACTORS [J]. SOLID-STATE ELECTRONICS, 1969, 12 (05) : 371 - &

[1] AGRAZGUERENA J, 1972, DEC INT EL DEV M WAS

[2] COPELAND JA, 1969, IEEE T ELECTRON DEVI, VED16, P445

[3] GARDNER EE, 1967, MEASUREMENT TECHNIQU

[4] Grove A. S., 1967, Physics and Technology of Semiconductor Devices

[5] GUPTA DC, 1970, REV SCI INSTRUM, V41, P1681, DOI 10.1063/1.1684463

[6] HOLM R, 1967, ELECTRIC CONTACTS HD

[7] LANGER PH, 1972, OCT MIAM BEACH M SOC

[8] MILLER GL, 1972, IEEE T ELECTRON DEVI, VED19, P1103

[9] COLLECTOR DIFFUSION ISOLATED INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE IEEE, 1969, 57 (09) : 1523 - +

[10] SPREADING RESISTANCE CORRECTION FACTORS [J]. SOLID-STATE ELECTRONICS, 1969, 12 (05) : 371 - &