AUGER DEPTH PROFILING OF AG LAYER EPITAXIALLY GROWN ON PB(111) SURFACE - A DIRECT EVIDENCE OF SUBSTRATE DIFFUSION

[1] CHEN CH, 1985, SURF SCI, V163, pL668

[2] A SIMPLE MODEL FOR DEPENDENCE OF AUGER INTENSITIES ON SPECIMEN THICKNESS [J]. SURFACE SCIENCE, 1969, 17 (02) : 486 - &

[3] MODEL FOR AUGER-ELECTRON SPECTROSCOPY OF SYSTEMS EXHIBITING LAYER GROWTH, AND ITS APPLICATION TO DEPOSITION OF SILVER ON NICKEL [J]. SURFACE SCIENCE, 1973, 36 (02) : 381 - 394

[4] MURR LE, 1975, INTERFACIAL PHENOMEN, P124

[5] SUBSTRATE-DIFFUSION-CONTROLLED FILM GROWTH - SILVER AND COPPER ON LEAD(111) [J]. THIN SOLID FILMS, 1980, 67 (01) : 171 - 178

[6] Shewmon P, 2016, DIFFUSION SOLIDS, DOI [10.1007/978-3-319-48206-4, DOI 10.1007/978-3-319-48206-4]

[7] HIGH-RESOLUTION SURFACE STUDY BY INSITU UHV TRANSMISSION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1982, 8 (1-2) : 145 - 161

[8] TAKAYANAGI K, 1982, SURFACE SCI, V100, P407

[1] CHEN CH, 1985, SURF SCI, V163, pL668

[2] A SIMPLE MODEL FOR DEPENDENCE OF AUGER INTENSITIES ON SPECIMEN THICKNESS [J]. SURFACE SCIENCE, 1969, 17 (02) : 486 - &

[3] MODEL FOR AUGER-ELECTRON SPECTROSCOPY OF SYSTEMS EXHIBITING LAYER GROWTH, AND ITS APPLICATION TO DEPOSITION OF SILVER ON NICKEL [J]. SURFACE SCIENCE, 1973, 36 (02) : 381 - 394

[4] MURR LE, 1975, INTERFACIAL PHENOMEN, P124

[5] SUBSTRATE-DIFFUSION-CONTROLLED FILM GROWTH - SILVER AND COPPER ON LEAD(111) [J]. THIN SOLID FILMS, 1980, 67 (01) : 171 - 178

[6] Shewmon P, 2016, DIFFUSION SOLIDS, DOI [10.1007/978-3-319-48206-4, DOI 10.1007/978-3-319-48206-4]

[7] HIGH-RESOLUTION SURFACE STUDY BY INSITU UHV TRANSMISSION ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1982, 8 (1-2) : 145 - 161

[8] TAKAYANAGI K, 1982, SURFACE SCI, V100, P407