CHARACTERIZATION OF BETA-SILICON NITRIDE WHISKERS

被引：16

作者：

HOMENY, J ^{[1
]}

NEERGAARD, LJ ^{[1
]}

KARASEK, KR ^{[1
]}

DONNER, JT ^{[1
]}

BRADLEY, SA ^{[1
]}

机构：

[1] ALLIED SIGNAL EMRC,DES PLAINES,IL 60017

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1990年 / 73卷 / 01期

关键词：

chemical properties; physical properties; silicon nitride; structure; whiskers;

D O I：

10.1111/j.1151-2916.1990.tb05098.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The physical, chemical, and structural properties of a commercially available β‐Si3N4 whisker were characterized. Bulk chemical analysis indicated that the whiskers were close to stoichiometric silicon nitride, with oxygen and yttrium as the major impurities. Surface chemistry analysis by XPS analysis revealed that the surfaces consisted primarily of silicon nitride, with the oxygen and yttrium impurities concentrated at the surfaces. SEM and STEM studies indicated that the whiskers were dimensionally straight with relatively featureless surfaces, although some whiskers had Y‐rich particles attached. The whiskers were also found to be of extreme crystallographic perfection, as determined by TEM analysis. Copyright © 1990, Wiley Blackwell. All rights reserved

引用

页码：102 / 105

页数：4