FT-IR SURFACE ELECTROMAGNETIC-WAVES SPECTROSCOPY OF LANGMUIR-BLODGETT-FILMS ON METAL-SURFACES

被引：6

作者：

ZHIZHIN, GN

SIGAREV, AA

YAKOVLEV, VA

机构：

[1] Institute of Spectroscopy, USSR Academy of Sciences

来源：

JOURNAL OF MOLECULAR LIQUIDS | 1992年 / 53卷

关键词：

D O I：

10.1016/0167-7322(92)80044-I

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The sensitivities of the SEW and the reflection-absorption FT IR spectroscopy methods are compared experimentally and theoretically on the example of the 4-n-octadecylphenol Langmuir-Blodgett films. The versatility of the broad-band SEW spectroscopy in investigating of thin films on metal surfaces have been demonstrated.

引用

页码：1 / 14

页数：14

共 21 条

[1]

Agranovich V. M., 1976, Soviet Physics - Uspekhi, V18, P99, DOI 10.1070/PU1975v018n02ABEH001948

[2] INTRODUCTORY THEORY FOR SURFACE ELECTROMAGNETIC-WAVE SPECTROSCOPY [J].