DIELECTRIC RELAXATION OF WATER MOLECULES IN OXIDE FILMS ON SILICON

[1] DIELECTRIC RELAXATION IN THERMALLY GROWN SIO2 FILMS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 268 - +

[2] AN ELLIPSOMETER INVESTIGATION OF VAPOR ADSORPTION ON ETCHED SILICON [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (06) : 646 - 652

[3] DORDA G, 1967, VERHANDL DPG, V2, P41

[4] HIROSE H, 1964, JPN J APPL PHYS, V3, P179

[5] AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 222 - +

[6] PETERS FG, 1966, AM CERAM SOC BULL, V45, P1017

[7] SKANAVI GI, 1949, PHYSICS DIELECTRICS, P475

[1] DIELECTRIC RELAXATION IN THERMALLY GROWN SIO2 FILMS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 268 - +

[2] AN ELLIPSOMETER INVESTIGATION OF VAPOR ADSORPTION ON ETCHED SILICON [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (06) : 646 - 652

[3] DORDA G, 1967, VERHANDL DPG, V2, P41

[4] HIROSE H, 1964, JPN J APPL PHYS, V3, P179

[5] AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 222 - +

[6] PETERS FG, 1966, AM CERAM SOC BULL, V45, P1017

[7] SKANAVI GI, 1949, PHYSICS DIELECTRICS, P475