HIGH-RESOLUTION MAGNETIC FORCE MICROSCOPY OF DOMAIN-WALL FINE-STRUCTURES (INVITED)

被引：49

作者：

PROKSCH, RB

FOSS, S

DAHLBERG, ED

机构：

[1] UNIV MINNESOTA, SCH PHYS & ASTRON, MINNEAPOLIS, MN 55455 USA

[2] UNIV MINNESOTA, CTR MAGNET MICROSCOPY, MINNEAPOLIS, MN 55455 USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1994年 / 30卷 / 06期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/20.334123

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Magnetic force microscope (MFM) images of various domain wall structures will be discussed. The systems studied in this work include single crystals of magnetite (Fe3O4) and a 0.51 mu m single crystal iron (Fe) film. In general, the observed structures can be explained in terms of a bulk Bloch wall terminated at the surface by a Neel cap. A model of the MFM response to such a structure has been fitted to the measured response, demonstrating the utility of MFM data for testing micromagnetic models.

引用

页码：4467 / 4472

页数：6