EXPERIMENTAL STUDY OF SURFACE CHANNEL IN INSULATED-GATE FIELD-EFFECT TRANSISTOR

被引:4
作者
BANDALI, MB
WRIGHT, GT
机构
关键词
D O I
10.1049/el:19710092
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:142 / &
相关论文
共 6 条
[1]   MOST CHANNEL-LENGTH MEASUREMENT [J].
BATEMAN, IM ;
MAGOWAN, JA .
ELECTRONICS LETTERS, 1970, 6 (21) :669-&
[2]   TRANSPORT PROPERTIES OF ELECTRONS IN INVERTED SILICON SURFACES [J].
FANG, FF ;
FOWLER, AB .
PHYSICAL REVIEW, 1968, 169 (03) :619-+
[3]   CARRIER MOBILITY IN SILICON MOSTS [J].
MURPHY, NSJ ;
BERZ, F ;
FLINN, I .
SOLID-STATE ELECTRONICS, 1969, 12 (10) :775-+
[4]  
VANNIELEN JA, 1967, PHILIPS RES REP, V22, P55
[5]   THEORY OF THE SPACE-CHARGE-LIMITED SURFACE-CHANNEL DIELECTRIC TRIODE [J].
WRIGHT, GT .
SOLID-STATE ELECTRONICS, 1964, 7 (02) :167-175