PHOTOREFLECTANCE IN NARROW-GAP HG1-XCDXTE AND HG1-YZNYTE

被引:6
作者
AMIRTHARAJ, PM
KENNEDY, JJ
BOYD, PR
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 05期
关键词
D O I
10.1116/1.574833
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:3184 / 3185
页数:2
相关论文
共 3 条
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AMIRTHARAJ, PM ;
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (04) :2028-2033
[2]   STUDY OF MERCURY CADMIUM TELLURIDE (MCT) SURFACES BY AUTOMATIC SPECTROSCOPIC ELLIPSOMETRY (ASE) AND BY ELECTROLYTE ELECTROREFLECTANCE (EER) [J].
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GARLAND, JW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (01) :138-142
[3]   LOW-FREQUENCY ADMITTANCE MEASUREMENTS ON THE HGCDTE/PHOTOX SIO2 INTERFACE [J].
TSAU, GH ;
SHER, A ;
MADOU, M ;
WILSON, JA ;
COTTON, VA ;
JONES, CE .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (04) :1238-1244