MEASUREMENT OF ELECTRON MEAN FREE PATH USING A BENDING EFFECT

被引：7

作者：

STILLWELL, EP

SKOVE, MJ

OVERCASH, DR

GETTYS, WB

机构：

[1] Department of Physics, Clemson University, Clemson, 29 631, South Carolina

来源：

PHYSIK DER KONDENSITERTEN MATERIE | 1969年 / 9卷 / 1-2期

关键词：

D O I：

10.1007/BF02422551

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

It has been observed experimentally that elastically bending a metal whisker increases its resistance. Such an increase in resistance depends on the metal, the temperature and the orientation of the whisker axis. This effect is observable below 6°K for Zn, 8°K for In, 20°K for Sn, and 300°K for Bi. It is suggested that the effect may be due to an enhancement of surface scattering due to the bending of the whisker. A calculation for such an effect for an ideal metal" is presented along with data for Zn and Bi. © 1969 Springer-Verlag."

引用

页码：183 / +

页数：1

共 9 条

[1] GROWTH OF ZINC WHISKERS [J].