FAILURE TIME AND RATE-CONSTANT OF DEGRADATION - AN ARGUMENT FOR THE INVERSE RELATIONSHIP

被引:13
作者
KLINGER, DJ
机构
[1] AT and T Bell Laboratories, Holmdel
来源
MICROELECTRONICS AND RELIABILITY | 1992年 / 32卷 / 07期
关键词
D O I
10.1016/0026-2714(92)90437-P
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the field of reliability engineering, the failure time is usually taken to be inversely proportional to the rate constant for the reaction that leads to failure. This relationship is then used to derive the accelerated life model. We show this assumption to be valid for any elementary reaction leading to failure, provided that the differential equation for the reaction rate is independent of any explicit time dependence, i.e. is autonomous in the variable representing time. We argue that such a form for the differential equation describing the rate of reaction that leads to failure is rather generally valid.
引用
收藏
页码:987 / 994
页数:8
相关论文
共 17 条
[1]  
[Anonymous], 1978, MATH METHODS CLASSIC, DOI [DOI 10.1007/978-1-4757-1693-1, 10.1007/978-1-4757-1693-1]
[2]  
Berne B J, 1976, DYNAMIC LIGHT SCATTE
[3]   MODEL FOR FAILURE RATE CURVES [J].
BOSCH, G .
MICROELECTRONICS AND RELIABILITY, 1979, 19 (04) :371-375
[4]  
Cox DR, 1984, ANAL SURVIVAL DATA, pviii
[5]   METHODOLOGY OF ACCELERATED AGING [J].
JOYCE, WB ;
LIOU, KY ;
NASH, FR ;
BOSSARD, PR ;
HARTMAN, RL .
AT&T TECHNICAL JOURNAL, 1985, 64 (03) :717-764
[6]  
JOYCE WB, 1985, AT&T TECH J, V64, P754
[7]  
JOYCE WB, 1985, AT&T TECH J, V64, P750
[8]  
KLINGER DJ, 1990, AT T RELIABILITY MAN
[9]  
LAWLESS JF, 1986, AT&T TECH J, V65, P69
[10]   ACCELERATION TRANSFORMS AND STATISTICAL KINETIC-MODELS [J].
LUVALLE, MJ ;
WELSHER, TL ;
SVOBODA, K .
JOURNAL OF STATISTICAL PHYSICS, 1988, 52 (1-2) :311-330