COMPARISON OF SILICON DENSITY STANDARDS AT NRLM AND IMGC

被引：12

作者：

PEUTO, AM ^{[1
]}

SACCONI, A ^{[1
]}

MOSCA, M ^{[1
]}

FUJII, KI ^{[1
]}

TANAKA, M ^{[1
]}

NEZU, Y ^{[1
]}

机构：

[1] NATL RES LAB METROL,TSUKUBA,IBARAKI 305,JAPAN

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1993年 / 42卷 / 02期

关键词：

D O I：

10.1109/19.278557

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

IMGC and NRLM have developed density standards in the form of single-crystal silicon spheres within their projects for the determination of the Avogadro constant. The results of the first intercomparison on two such artifacts are presented: the mass and volume of the IMGC sphere were measured at NRLM with an absolute method, whereas at IMGC, the density of the NRLM sphere was measured by hydrostatic comparison to the IMGC silicon standard. Additional diameter measurements were also made. The overall results have shown an excellent agreement: within 0.16 ppm in density, 0.1 ppm in mass, 0.06 ppm in volume, and 0.04 ppm in diameter measurements.

引用

页码：242 / 246

页数：5