PB-IMPLANTED SRTIO3 ANALYZED USING RUTHERFORD BACKSCATTERING AND SURFACE SENSITIVE EXAFS XANES SPECTROSCOPY

被引：7

作者：

GREEGOR, RB

LYTLE, FW

ARNOLD, GW

EWING, RC

机构：

[1] SANDIA NATL LABS,ALBUQUERQUE,NM 87185

[2] UNIV NEW MEXICO,DEPT GEOL,ALBUQUERQUE,NM 87131

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1990年 / 122卷 / 02期

基金：

美国国家卫生研究院;

关键词：

D O I：

10.1016/0022-3093(90)91057-X

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Rutherford backscattering (RBS) and X-ray absorption spectroscopy (XAS) were used to investigate the effect of 50 and 200 keV Pb ions implanted in SrTiO3 at room temperature to a fluence of 1-2 × 104 Pb/cm2. At this fluence the 200 keV Pb-implanted sample became amorphous. The implantations caused a decrease in the symmetry at the Ti site and decreased long range order due to an increased range of bond angles and distances. Reduction in the TiM peak magnitude of the Fourier transform of the EXAFS data for the 200 keV Pb-irradiated sample was interpreted as due to a change by 20-35° degrees from collinearity of the TiOTi bond. The structural changes observed in the nearest and more distant neighbors around the Ti indicated that the 200 keV Pb-implanted sample exists in an aperiodic, random network. © 1990.

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收藏

页码：121 / 132

页数：12

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