DEPTH DEPENDENCE FOR EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE SPECTROSCOPY DETECTED VIA ELECTRON YIELD IN HE AND IN VACUUM

被引：131

作者：

ELAM, WT

KIRKLAND, JP

NEISER, RA

WOLF, PD

机构：

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 01期

关键词：

D O I：

10.1103/PhysRevB.38.26

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：26 / 30

页数：5

共 14 条

[1] CONVERSION-ELECTRON EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE MEASUREMENTS OF ION-DAMAGED GAAS
BOULDIN, CE
FORMAN, RA
BELL, MI
[J]. PHYSICAL REVIEW B, 1987, 35 (03): : 1429 - 1432
[2] CARGILL GS, 1987, B AM PHYS SOC, V32, P508
[3] COSLETT VE, 1964, J APPL PHYS, V15, P883
[4] EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE - DIRECT COMPARISON OF ABSORPTION AND ELECTRON YIELD
GUO, T
DENBOER, ML
[J]. PHYSICAL REVIEW B, 1985, 31 (10): : 6233 - 6237
[5] THEORY OF ELECTRON RE-EMISSION MOSSBAUER-SPECTROSCOPY
HUFFMAN, GP
[J]. NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (02): : 267 - 290
[6] ELECTRON SCATTERING BY THIN FOILS FOR ENERGIES BELOW 10 KEV
KANTER, H
[J]. PHYSICAL REVIEW, 1961, 121 (02): : 461 - &
[7] ELECTRON-YIELD EXTENDED X-RAY ABSORPTION FINE-STRUCTURE WITH THE USE OF A GAS-FLOW ELECTRON DETECTOR
KORDESCH, ME
HOFFMAN, RW
[J]. PHYSICAL REVIEW B, 1984, 29 (01): : 491 - 492
[8] ANALYSIS OF ELECTRON-TRANSPORT IN CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (CEMS)
LILJEQUIST, D
EKDAHL, T
BAVERSTAM, U
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 155 (03): : 529 - 538
[9] LYTLE FW, 1986, J PHYS C SOLID STATE, V8, P149
[10] IONIZATION OF NOBLE-GASES BY PROTONS - JESSE EFFECTS AS A FUNCTION OF PRESSURE
PARKS, JE
WEIDNER, HL
STEWART, TE
HURST, GS
[J]. JOURNAL OF CHEMICAL PHYSICS, 1972, 57 (12) : 5467 - &