ELECTRON-YIELD EXTENDED X-RAY ABSORPTION FINE-STRUCTURE WITH THE USE OF A GAS-FLOW ELECTRON DETECTOR

被引：74

作者：

KORDESCH, ME

HOFFMAN, RW

机构：

来源：

PHYSICAL REVIEW B | 1984年 / 29卷 / 01期

关键词：

D O I：

10.1103/PhysRevB.29.491

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：491 / 492

页数：2

共 8 条

[1]

Brown G. S., 1980, Synchrotron radiation research, P353

[2] FLUORESCENCE DETECTION OF EXAFS - SENSITIVITY ENHANCEMENT FOR DILUTE SPECIES AND THIN-FILMS [J].

JAKLEVIC, J ;

KIRBY, JA ;

KLEIN, MP ;

ROBERTSON, AS ;

BROWN, GS ;

EISENBERGER, P .

SOLID STATE COMMUNICATIONS, 1977, 23 (09) :679-682

[3] CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY AND STUDY OF SURFACE PROPERTIES AND REACTIONS [J].

JONES, W ;

THOMAS, JM ;

THORPE, RK ;

TRICKER, MJ .

APPLIED SURFACE SCIENCE, 1978, 1 (03) :388-407

[4]

KORDESCH ME, 1983, J ELECTROCHEM SOC EX

[5] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL [J].

LEE, PA ;

CITRIN, PH ;

EISENBERGER, P ;

KINCAID, BM .

REVIEWS OF MODERN PHYSICS, 1981, 53 (04) :769-806

[6] HIGH PASS PHOTO-CATHODE X-RAY IONIZATION-CHAMBER FOR SURFACE EXAFS [J].

SHEVCHIK, NJ ;

FISCHER, DA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (05) :577-581

[7] THEORY OF KLL AUGER ENERGIES INCLUDING STATIC RELAXATION [J].

SHIRLEY, DA .

PHYSICAL REVIEW A, 1973, 7 (05) :1520-1528

[8] EXAFS AND SURFACE-EXAFS STUDIES IN THE SOFT-X-RAY REGION USING ELECTRON YIELD SPECTROSCOPY [J].

STOHR, J .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (01) :37-41

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