EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE - DIRECT COMPARISON OF ABSORPTION AND ELECTRON YIELD

被引：56

作者：

GUO, T

DENBOER, ML

机构：

来源：

PHYSICAL REVIEW B | 1985年 / 31卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.31.6233

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

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页码：6233 / 6237

页数：5

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