DISCREPANCIES IN X-RAY-EXCITATION EFFICIENCIES USING A SI(LI) DETECTOR SYSTEM

被引:8
作者
SINGH, SP
BHAN, C
NATH, N
机构
[1] Physics Department, Kurukshetra University
来源
NUCLEAR INSTRUMENTS & METHODS | 1979年 / 165卷 / 02期
关键词
D O I
10.1016/0029-554X(79)90296-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
X-ray excitation efficiency measurement using a Si(Li) detector shows a decrease relative to the calculated values for higher Z. In the present analysis we study the contribution of the system geometry to the effective detector efficiency and hence to the observed values of the excitation efficiency. © 1979.
引用
收藏
页码:359 / 359
页数:1
相关论文
共 2 条
[1]   TRACE-ELEMENT DETERMINATION WITH SEMICONDUCTOR DETECTOR X-RAY SPECTROMETERS [J].
GIAUQUE, RD ;
GOULDING, FS ;
JAKLEVIC, JM ;
PEHL, RH .
ANALYTICAL CHEMISTRY, 1973, 45 (04) :671-681
[2]  
WATSON RL, 1978, ADV XRAY ANAL, V21, P105