EFFECTS OF STRAIN ON THE ELECTRON-DIFFRACTION CONTRAST AT III-V-COMPOUND HETEROSTRUCTURE INTERFACES

被引:18
作者
BANGERT, U
CHARSLEY, P
机构
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1989年 / 59卷 / 03期
关键词
D O I
10.1080/01418618908229788
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:629 / 643
页数:15
相关论文
共 6 条
[1]   TRANSMISSION ELECTRON-MICROSCOPE IMAGE-CONTRAST OF EPITAXIAL INTERFACES WITH SMALL MISFITS [J].
AURET, FD ;
BALL, CAB ;
SNYMAN, HC .
THIN SOLID FILMS, 1979, 61 (03) :289-295
[2]  
BANGERT U, 1980, IN PRESS
[3]   ELECTRON MICROSCOPE TRANSMISSION IMAGES OF COHERENT DOMAIN BOUNDARIES .1. DYNAMICAL THEORY [J].
GEVERS, R ;
DELAVIGNETTE, P ;
BLANK, H ;
AMELINCKX, S .
PHYSICA STATUS SOLIDI, 1964, 4 (02) :383-410
[4]   ELECTRON MICROSCOPE TRANSMISSION IMAGES OF COHERENT DOMAIN BOUNDARIES .2. OBSERVATIONS [J].
GEVERS, R ;
DELAVIGNETTE, P ;
BLANK, H ;
VANLANDUYT, J ;
AMELINCKX, S .
PHYSICA STATUS SOLIDI, 1964, 5 (03) :595-633
[5]   DIFFRACTION CONTRAST OF ELECTRON MICROSCOPE IMAGES OF CRYSTAL LATTICE DEFECTS .3. RESULTS AND EXPERIMENTAL CONFIRMATION OF DYNAMICAL THEORY OF DISLOCATION IMAGE CONTRAST [J].
HOWIE, A ;
WHELAN, MJ .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1962, 267 (1329) :206-&
[6]   COMPOSITION DEPENDENCE OF EQUAL THICKNESS FRINGES IN AN ELECTRON-MICROSCOPE IMAGE OF GAAS/ALXGA1-XAS MULTILAYER STRUCTURE [J].
KAKIBAYASHI, H ;
NAGATA, F .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (12) :L905-L907