OHMIC MOBILITY OF HOLES IN SILICON

[1] ALBERIGIQUARANT.A, TO BE PUBLISHED

[2] LATTICE VIBRATIONS IN SILICON AND GERMANIUM [J]. PHYSICAL REVIEW LETTERS, 1959, 2 (06) : 256 - 258

[3] ANALYSIS OF LATTICE AND IONIZED IMPURITY SCATTERING IN P-TYPE GERMANIUM [J]. PHYSICAL REVIEW, 1962, 127 (05): : 1593 - &

[4] CONWELL EM, 1967, SOLID STATE PHYSI S9

[5] TEMPERATURE-DEPENDENCE OF COMBINED EFFECTIVE MASS OF HOLES IN SILICON [J]. LETTERE AL NUOVO CIMENTO, 1970, 3 (08): : 239 - &

[6] COSTATO M, 1969, ATTI SEMIN MAT FIS, V18, P144

[7] COSTATO M, 1965, INFNFM684 I NAZ FIS

[8] DIRECT MEASUREMENT OF THE DIELECTRIC CONSTANTS OF SILICON AND GERMANIUM [J]. PHYSICAL REVIEW, 1953, 92 (06): : 1396 - 1397

[9] DYKMAN IM, 1960, FIZ TVERD TELA, V2, P2228

[10] DYKMAN IM, 1960, SOV PHYS-SOLID STATE, V2, P1988

[1] ALBERIGIQUARANT.A, TO BE PUBLISHED

[2] LATTICE VIBRATIONS IN SILICON AND GERMANIUM [J]. PHYSICAL REVIEW LETTERS, 1959, 2 (06) : 256 - 258

[3] ANALYSIS OF LATTICE AND IONIZED IMPURITY SCATTERING IN P-TYPE GERMANIUM [J]. PHYSICAL REVIEW, 1962, 127 (05): : 1593 - &

[4] CONWELL EM, 1967, SOLID STATE PHYSI S9

[5] TEMPERATURE-DEPENDENCE OF COMBINED EFFECTIVE MASS OF HOLES IN SILICON [J]. LETTERE AL NUOVO CIMENTO, 1970, 3 (08): : 239 - &

[6] COSTATO M, 1969, ATTI SEMIN MAT FIS, V18, P144

[7] COSTATO M, 1965, INFNFM684 I NAZ FIS

[8] DIRECT MEASUREMENT OF THE DIELECTRIC CONSTANTS OF SILICON AND GERMANIUM [J]. PHYSICAL REVIEW, 1953, 92 (06): : 1396 - 1397

[9] DYKMAN IM, 1960, FIZ TVERD TELA, V2, P2228

[10] DYKMAN IM, 1960, SOV PHYS-SOLID STATE, V2, P1988