OPTICAL BINDING IN SCANNING PROBE MICROSCOPY

被引：13

作者：

DEREUX, A

GIRARD, C

MARTIN, OJF

DEVEL, M

机构：

[1] IBM CORP,DIV RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

[2] UNIV FRANCHE COMTE,PHYS MOLEC LAB,CNRS,UA 772,F-25030 BESANCON,FRANCE

来源：

EUROPHYSICS LETTERS | 1994年 / 26卷 / 01期

关键词：

D O I：

10.1209/0295-5075/26/1/007

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

When a light beam impinges on two interacting objects of subwavelength size, a spatially confined electromagnetic field arises in the immediate proximity of the particles. In scanning probe microscopy, short-range forces induced by this electromagnetic near-field change the magnitude of the probe tip-substrate interaction. In this letter we analyse the physical process responsible for these forces in the context of the localized field susceptibility method.

引用

页码：37 / 42

页数：6

共 17 条

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