ELECTRON-IMPACT MULTIPLE IONIZATION CROSS-SECTION OF ARGON (SIGMA-N+, N=3-6)

被引：16

作者：

ALMEIDA, DP

FONTES, AC

MATTOS, IS

GODINHO, CL

机构：

[1] Espectrômetro de Massa por Colisão Eletrônica, Instituto de Física, Universidade Federal do Rio de Janeiro, Rio de Janeiro

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1994年 / 67卷 / 03期

关键词：

D O I：

10.1016/0368-2048(93)2030P-R

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Multiple ionization cross sections of argon (Ar-Ar(n+) with n = 3-6) by electron impact have been measured with energies ranging from threshold up to 2000 eV, by a time-of-flight technique. A comparison with other experimental data is presented and discrepancies are discussed. The integrated oscillator strengths (M(n)2) for the processes have been determined showing good agreement with previously reported data.

引用

页码：503 / 510

页数：8

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