MECHANISM FOR ANNEALING-INDUCED CHANGES IN THE ELECTRICAL CHARACTERISTICS OF AL/GAAS AND AL/INP SCHOTTKY CONTACTS

被引：36

作者：

NEWMAN, N ^{[1
]}

SPICER, WE ^{[1
]}

WEBER, ER ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY,DEPT MAT SCI,BERKELEY,CA 94720

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.583766

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1020 / 1029

页数：10

相关论文

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