DETECTION OF DANGLING BONDS IN THE MECHANICALLY MILLED H-BN NANOCRYSTALS BY RESONANCE X-RAY-SCATTERING ABOVE-THRESHOLD

被引:7
作者
KAWAI, J
TADOKORO, S
MURAMATSU, Y
KASHIWAI, S
KOHZUKI, H
MOTOYAMA, M
KATO, H
ADACHI, H
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP, INTERDISCIPLINARY RES LABS, MUSASHINO, TOKYO 180, JAPAN
[2] HYOGO PREFECTURAL INST IND RES, SUMA KU, KOBE 654, JAPAN
[3] NATL LAB HIGH ENERGY PHYS, PHOTON FACTORY, TSUKUBA, IBARAKI 305, JAPAN
关键词
D O I
10.1016/0921-4526(94)00674-K
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Boron 2p density of states are calculated and compared with X-ray fluorescence spectra of h-BN. The high energy satellite, which was assigned to resonance X-ray scattering peak, is found to be Is electron scattered by nonbonding unoccupied orbitals. Thus it is concluded that the resonance peak intensity is a measure of the density of dangling bonds in a nanocrystal.
引用
收藏
页码:251 / 252
页数:2
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