DIRECT MEASUREMENT OF THE POWER SPECTRUM OF ROUGH SURFACES BY OPTICAL FOURIER TRANSFORMATION

被引：12

作者：

THWAITE, EG

机构：

[1] CSIRO National Measurement Laboratory, Sydney

来源：

WEAR | 1979年 / 57卷 / 01期

关键词：

D O I：

10.1016/0043-1648(79)90141-8

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

Conditions which allow the reliable measurement of the power spectrum of opaque rough surfaces by direct optical Fourier transformation were determined. The relation of the spectrum of the surface irregularities to the optically observed spectrum is discussed and the experimental results obtained to date with a transform apparatus are presented. Consideration is given to the range of roughness values to which the method may be reliably applied. © 1979.

引用

页码：71 / 80

页数：10

共 9 条

[1] SURFACE ROUGHNESS STUDIES BY OPTICAL PROCESSING METHODS [J].

ANDERSON, WL .

PROCEEDINGS OF THE IEEE, 1969, 57 (01) :95-&

[2]

CUNY B, 1955, REV OPT, V34, P464

[3]

Goodman J. W., 2005, INTRO FOURIER OPTICS

[4] LIGHT-SCATTERING FROM FUSED POLYCRYSTALLINE ALUMINUM-OXIDE SURFACES [J].

HENSLER, DH .

APPLIED OPTICS, 1972, 11 (11) :2522-&

[5]

LONGUETHIGGINS MS, 1962, 13TH P S APPL MATH A, P105

[6] SOME ASPECTS OF DIFFRACTION THEORY AND THEIR APPLICATION TO THE IONOSPHERE [J].

RATCLIFFE, JA .

REPORTS ON PROGRESS IN PHYSICS, 1956, 19 :188-267

[7] USE OF OPTICAL DATA PROCESSING TECHNIQUES FOR SURFACE ROUGHNESS STUDIES [J].

RIBBENS, WB ;

LAZIK, GL .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1968, 56 (09) :1637-&

[8]

STEEL WH, 1974, J OPT INDIA, V2, P36

[9] OPTICAL ESTIMATION OF STATISTICS OF SURFACE-ROUGHNESS FROM LIGHT-SCATTERING MEASUREMENTS [J].

WELFORD, WT .

OPTICAL AND QUANTUM ELECTRONICS, 1977, 9 (04) :269-287

← 1 →