SURFACE CHARGE EFFECTS ON RESISTIVITY AND HALL-COEFFICIENT OF THIN SILICON-ON-SAPPHIRE FILMS

被引：16

作者：

HAM, WE

机构：

来源：

APPLIED PHYSICS LETTERS | 1972年 / 21卷 / 09期

关键词：

D O I：

10.1063/1.1654448

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：440 / +

页数：1

共 24 条

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[8]

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