OPTOELECTRONIC APPLICATIONS OF LTMBE III-V MATERIALS

被引:72
作者
WHITAKER, JF
机构
[1] Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, MI 48109-2099, 2200 Bonisteel Blvd
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1993年 / 22卷 / 01期
基金
美国国家科学基金会;
关键词
D O I
10.1016/0921-5107(93)90224-B
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A review of the application of semiconductor layers grown at low substrate temperatures to ultrafast optoelectronics is presented. The films, grown by molecular beam epitaxy primarily around 200 degrees C and subsequently annealed, are demonstrated to have high resistivity, high mobility, an ultrashort carrier lifetime, and a high dielectric breakdown. This combination of properties makes the low-temperature-grown materials perfectly suited for use in high-speed optoelectronic devices. A number of issues which influence the application of these materials, such as growth temperature, use of an annealing process, layer thickness, and optical wavelength, are considered. Examples of low-temperature-grown semiconductor optoelectronic devices, including ultra-high-bandwidth photoconductive detectors, high-sensitivity, high-bandwidth MSM photodetectors, and optical temporal analyzers are demonstrated. While the discussion concentrates on low-temperatures-grown GaAs, the lattice-mismatched ternary compound InxGal-xAs/GaAs is also considered in the context of detection of the longer wavelengths used in optical communications.
引用
收藏
页码:61 / 67
页数:7
相关论文
共 31 条
[1]   PICOSECOND OPTOELECTRONIC SWITCHING AND GATING IN SILICON [J].
AUSTON, DH .
APPLIED PHYSICS LETTERS, 1975, 26 (03) :101-103
[2]   CARRIER-INDUCED CHANGE IN REFRACTIVE-INDEX OF INP, GAAS, AND INGAASP [J].
BENNETT, BR ;
SOREF, RA ;
DELALAMO, JA .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1990, 26 (01) :113-122
[3]   375-GHZ-BANDWIDTH PHOTOCONDUCTIVE DETECTOR [J].
CHEN, Y ;
WILLIAMSON, S ;
BROCK, T ;
SMITH, FW ;
CALAWA, AR .
APPLIED PHYSICS LETTERS, 1991, 59 (16) :1984-1986
[4]  
CHENG HJ, IN PRESS ULTRAFAST E
[5]  
CHENG HJ, 1993, IEEE T MICROW THEORY, V3, P1355
[6]   CARRIER LIFETIME VERSUS ION-IMPLANTATION DOSE IN SILICON ON SAPPHIRE [J].
DOANY, FE ;
GRISCHKOWSKY, D ;
CHI, CC .
APPLIED PHYSICS LETTERS, 1987, 50 (08) :460-462
[7]  
FOYT AG, 1982, APPL PHYS LETT, V40, P448
[8]   PICOSECOND PULSE FORMATION BY TRANSMISSION-LINE DISCONTINUITIES [J].
FRANKEL, MY ;
GUPTA, S ;
VALDMANIS, JA ;
MOUROU, GA .
ELECTRONICS LETTERS, 1989, 25 (20) :1363-1365
[9]   OPTOELECTRONIC TRANSIENT CHARACTERIZATION OF ULTRAFAST DEVICES [J].
FRANKEL, MY ;
WHITAKER, JF ;
MOUROU, GA .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1992, 28 (10) :2313-2324
[10]   HIGH-VOLTAGE PICOSECOND PHOTOCONDUCTOR SWITCH BASED ON LOW-TEMPERATURE-GROWN GAAS [J].
FRANKEL, MY ;
WHITAKER, JF ;
MOUROU, GA ;
SMITH, FW ;
CALAWA, AR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1990, 37 (12) :2493-2498