A REAL SPACE INVESTIGATION OF THE DIMER DEFECT STRUCTURE OF SI(001)-(2X8)

被引：107

作者：

NIEHUS, H ^{[1
]}

KOHLER, UK ^{[1
]}

COPEL, M ^{[1
]}

DEMUTH, JE ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01444.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：735 / 742

页数：8

共 13 条

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