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A REAL SPACE INVESTIGATION OF THE DIMER DEFECT STRUCTURE OF SI(001)-(2X8)
被引:107
作者
:
NIEHUS, H
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
NIEHUS, H
[
1
]
KOHLER, UK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
KOHLER, UK
[
1
]
COPEL, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
COPEL, M
[
1
]
DEMUTH, JE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
DEMUTH, JE
[
1
]
机构
:
[1]
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
:
JOURNAL OF MICROSCOPY-OXFORD
|
1988年
/ 152卷
关键词
:
D O I
:
10.1111/j.1365-2818.1988.tb01444.x
中图分类号
:
TH742 [显微镜];
学科分类号
:
摘要
:
引用
收藏
页码:735 / 742
页数:8
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共 13 条
[11]
ION-BEAM CRYSTALLOGRAPHY OF SILICON SURFACES .2. SI(100)-(2X1)
TROMP, RM
论文数:
0
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0
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XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
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XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
SARIS, FW
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论文数:
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0
机构:
XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
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CHADI, DJ
[J].
SURFACE SCIENCE,
1983,
133
(01)
: 137
-
158
[12]
SURFACE MODIFICATIONS INDUCED BY ADSORBATES AT LOW COVERAGE - A SCANNING-TUNNELING-MICROSCOPY STUDY OF THE NI/SI(111) SQUARE-ROOT-19 SURFACE
WILSON, RJ
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WILSON, RJ
CHIANG, S
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CHIANG, S
[J].
PHYSICAL REVIEW LETTERS,
1987,
58
(24)
: 2575
-
2578
[13]
THE 2 X 1 STRUCTURAL RECONSTRUCTION OF SI(001)
YANG, WS
论文数:
0
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0
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SUNY STONY BROOK,DEPT MAT SCI & ENGN,STONY BROOK,NY 11794
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JONA, F
MARCUS, PM
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0
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0
h-index:
0
机构:
SUNY STONY BROOK,DEPT MAT SCI & ENGN,STONY BROOK,NY 11794
MARCUS, PM
[J].
SOLID STATE COMMUNICATIONS,
1982,
43
(11)
: 847
-
851
←
1
2
→