ELECTRONIC-STRUCTURE CHARACTERIZATION OF ION-BEAM MODIFIED POLYIMIDE BY OPTICAL-ABSORPTION AND REFLECTION

被引：12

作者：

DAVENAS, J

THEVENARD, P

机构：

[1] Département de Physique des Matériaux (URA CNRS 172), Université Claude Bernard Lyon 1

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1991年 / 59卷 / pt 2期

关键词：

D O I：

10.1016/0168-583X(91)95804-M

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Optical absorption and specular reflection spectrophotometries have been used to determine the optical constants of PMDA-ODA polyimide films irradiated with 2 MeV Kr+ at different increasing ion fluences. The optical data are discussed in terms of interband transitions. The real and imaginary part of the complex optical index are calculated as a function of the wavelength in the energy range 500-2500 nm. Their comparison with the optical index of diamond and graphite shows diamondlike properties of the irradiated film at low fluences whereas graphitelike properties appear at the insulator-metal transition in correlation with the bandgap closing.

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页码：1249 / 1252

页数：4

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