X-RAY-FLUORESCENCE ANALYSIS IN THE NG REGION USING TOTAL REFLECTION OF THE PRIMARY BEAM

被引:35
作者
WOBRAUSCHEK, P
AIGINGER, H
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D O I
10.1016/0584-8547(80)80036-X
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
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页码:607 / 614
页数:8
相关论文
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[5]   TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRIC DETERMINATION OF ELEMENTS IN NANOGRAM AMOUNTS [J].
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AIGINGER, H .
ANALYTICAL CHEMISTRY, 1975, 47 (06) :852-855
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WOBRAUSCHEK P, 1975, THESIS TU WIEN, P29