HOT-ELECTRON EFFECTS IN SILICON-ON-INSULATOR N-CHANNEL MOSFET

被引:56
作者
COLINGE, JP
机构
关键词
D O I
10.1109/T-ED.1987.23213
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:2173 / 2177
页数:5
相关论文
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