A HIGH-RESOLUTION ELECTROSTATIC ANALYZER FOR ACCELERATOR MASS-SPECTROMETRY

被引：11

作者：

MATTESON, S

MCDANIEL, FD

DUGGAN, JL

ANTHONY, JM

BENNETT, TJ

BEAVERS, RL

机构：

[1] TEXAS INSTRUMENTS INC,CENT RES LAB,DALLAS,TX 75265

[2] UNIV N TEXAS,CTR MAT CHARACTERIZAT,DENTON,TX 76203

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 40-1卷

关键词：

D O I：

10.1016/0168-583X(89)90471-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：759 / 761

页数：3

共 6 条

[1] ACCELERATOR MASS-SPECTROMETRY AT THE UNIVERSITY-OF-NORTH-TEXAS [J].

ANTHONY, JM ;

MATTESON, S ;

MCDANIEL, FD ;

DUGGAN, JL .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 40-1 :731-733

[2] DETECTION OF SEMICONDUCTOR DOPANTS USING ACCELERATOR MASS-SPECTROMETRY [J].

ANTHONY, JM ;

DONAHUE, DJ ;

JULL, AJT ;

ZABEL, TH .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 10-1 (MAY) :498-500

[3]

BLATTNER RJ, 1986, SECONDARY ION MASS S, V5, P192

[4]

ERGAKOV VA, 1971, PRIB TEKH EKSP, V6, P20

[5] ATTEMPT TO DETECT STABLE N- IONS FROM A SPUTTER ION-SOURCE AND SOME IMPLICATIONS OF RESULTS FOR DESIGN OF TANDEMS FOR ULTRA-SENSITIVE CARBON ANALYSIS [J].

PURSER, KH ;

LIEBERT, RB ;

LITHERLAND, AE ;

BEUKENS, RP ;

GOVE, HE ;

BENNETT, CL ;

CLOVER, MR ;

SONDHEIM, WE .

REVUE DE PHYSIQUE APPLIQUEE, 1977, 12 (10) :1487-1492

[6]

WOLLNIK H, 1967, FOCUSING CHARGED PAR, P163

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