TRACER DIFFUSION OF OXYGEN IN BI2SR2CACU2OX

被引：78

作者：

RUNDE, M

ROUTBORT, JL

ROTHMAN, SJ

GORETTA, KC

MUNDY, JN

XU, X

BAKER, JE

机构：

[1] ARGONNE NATL LAB,DIV MAT & COMPONENTS TECHNOL,ARGONNE,IL 60439

[2] UNIV ILLINOIS,CTR MICROANAL MAT,URBANA,IL 61801

[3] NORWEGIAN ELECT POWER RES INST,N-7034 TRONDHEIM,NORWAY

来源：

PHYSICAL REVIEW B | 1992年 / 45卷 / 13期

关键词：

D O I：

10.1103/PhysRevB.45.7375

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Tracer diffusion of O-18 has been investigated in dense polycrystals and in the c direction in single crystals of Bi2Sr2CaCu2Ox between 300 and 700-degrees-C under one atmosphere of oxygen. Penetration profiles were determined by secondary-ion mass spectrometry. The diffusional anisotropy as measured by the ratio of the diffusion coefficients in the polycrystals [D = 1.7 x 10(-5) exp(-0.93 eV/kT) cm2/s] to the diffusion coefficients parallel to the c axis of the single crystals [D = 0.6 exp(-2.20 eV/kT) cm2/s] is large and temperature dependent. The results suggest that diffusion in the ab plane and in the c direction takes place by different mechanisms.

引用

页码：7375 / 7382

页数：8

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