LARGE DIFFERENCES IN TI THERMAL-DIFFUSION CAUSED DOMAIN INVERSION BETWEEN UNDOPED AND MGO-DOPED LINBO3

被引:2
作者
XU, CQ
OKAYAMA, H
KAWAHARA, M
机构
[1] Semiconductor Technology Laboratory, Oki Electric Industry Co. Ltd., Hachioji, Tokyo 193
关键词
D O I
10.1063/1.111580
中图分类号
O59 [应用物理学];
学科分类号
摘要
The periodic modulation of domain polarizations by Ti thermal diffusion on the + c face of LiNbO3 with and without MgO doping was studied systematically. It was shown that the depth of the inverted domain is quite different for these two substrates. Under the same fabrication conditions, the depth of domain inversion in the MgO-doped substrate is less than one-tenth that of the undoped substrate. This large difference can be explained by the presence of MgO in LiNbO3, which decreases the Ti diffusion constant and increases the minimum Ti concentration required for domain inversion.
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页码:2504 / 2506
页数:3
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