EVIDENCE FOR A BRICK WALL MICROSTRUCTURE IN EPITAXIAL YBA2CU3OX FILMS

被引：2

作者：

GAO, ZX

HEYVAERT, I

WUYTS, B

OSQUIGUIL, E

VANHAESENDONCK, C

BRUYNSERAEDE, Y

机构：

[1] CTR ATOM,RA-8400 BARILOCHE,ARGENTINA

[2] BEIJING UNIV,NATL LAB MESOSCOP PHYS,BEIJING 100871,PEOPLES R CHINA

来源：

APPLIED PHYSICS LETTERS | 1994年 / 65卷 / 06期

关键词：

D O I：

10.1063/1.112225

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have measured the in-plane (ab plane) critical current density J(c) in sputtered, c-axis oriented YBa2Cu3Ox films as a function of the oxygen content x. The important reduction of J(c) with decreasing x can be explained in terms of a ''brick wall'' microstructure, where the critical current density is dominated by the coupling strength (along the c axis) between the superconducting CuO2 planes. Scanning tunneling microscopy images of the film surfaces are consistent with the presence of the brick wall structure, which apparently results from the overlap between terraces belonging to adjacent spiral-shaped islands.

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页码：770 / 772

页数：3

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