FILLING OF MICRON-SIZED CONTACT HOLES WITH COPPER BY ENERGETIC CLUSTER-IMPACT

被引:338
作者
HABERLAND, H [1 ]
MALL, M [1 ]
MOSELER, M [1 ]
QIANG, Y [1 ]
REINERS, T [1 ]
THURNER, Y [1 ]
机构
[1] UNIV FREIBURGM, FAK PHYS, D-79104 FREIBURG, GERMANY
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1994年 / 12卷 / 05期
关键词
D O I
10.1116/1.578967
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A completely ionized and clustered beam of Mo or Cu is deposited with variable kinetic energy on a substrate, and the filling of micron-sized contact holes on semiconductor devices is studied. An excellent hole filling is obtained for the impact of charged copper clusters, if they contain 1000-3000 Cu atoms and impinge with a kinetic energy of about 10 eV per atom on a substrate having a temperature of 500 K. The morphology of small hole fillings by slow and energetic cluster impact is discussed.
引用
收藏
页码:2925 / 2930
页数:6
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