COPPER DEPOSITION BY ELECTRON-CYCLOTRON-RESONANCE PLASMA

被引:79
作者
HOLBER, WM
LOGAN, JS
GRABARZ, HJ
YEH, JTC
CAUGHMAN, JBO
SUGERMAN, A
TURENE, FE
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
[2] IBM CORP,TECHNOL PROD,HOPEWELL JCT,NY 12533
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1993年 / 11卷 / 06期
关键词
D O I
10.1116/1.578666
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
An electron cyclotron resonance plasma reactor has been built in order to study the filling of high aspect-ratio features on semiconductor devices with metal. The reactor produces a plasma of copper which is nearly 100% ionized at the substrate, without the use of any buffer or carrier gas. The ion flux is dependent on both the feed rate of copper neutrals into the plasma region, and on the microwave power absorbed in the plasma. Solid filling of features having aspect ratios as high as 4.2 is demonstrated, and a simple model is derived to explain the fill characteristics.
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页码:2903 / 2910
页数:8
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