PROPERTIES OF BAPB1-XBIXO3 AS OBSERVED IN SINGLE-CRYSTAL THIN-FILMS

被引:12
作者
SUZUKI, M
机构
[1] NTT Interdisciplinary Research Laboratories, Nippon Telegraph and Telephone Corporation, Tokai, Ibaraki
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1993年 / 32卷 / 6A期
关键词
BAPB1-XBIXO3; EPITAXIAL THIN FILMS; RESISTIVITY; HALL COEFFICIENT; UPPER CRITICAL FIELD;
D O I
10.1143/JJAP.32.2640
中图分类号
O59 [应用物理学];
学科分类号
摘要
The resistivity, low-field Hall coefficient, optical transmission, reflectivity, and upper critical field have been measured for BaPb1-xBixO3 Single-crystal thin films as a function of Bi content x. It is found that the semiconductive temperature dependence of resistivity. which evolves as x increases from 0.25, is intrinsic to the BaPb1-xBixO3 system. When x exceeds 0.3, the resistivity abruptly increases and the superconductivity disappears. These changes are accompanied by a change in the sign of the Hall coefficient. Based on these experimental results, a systematic change of the electronic structure of the BaPb1-xBixO3 system is discussed. Furthermore, various physical properties of the BaPb1-xBixO3 system are also derived based on a simple assumption.
引用
收藏
页码:2640 / 2647
页数:8
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