ANALYSIS OF LIGHT-ELEMENTS WITH A NUCLEAR MICROPROBE - A REVIEW

被引：18

作者：

DEMORTIER, G

机构：

[1] LARN, Facultés Universitaires Notre-Dame de la Paix, B-5000 Namur

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1995年 / 104卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(95)00387-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The best cross-sections data of nuclear reactions for the analysis of light elements with a microbeam (1-50 mu m) are discussed. Analytical results from the literature of the last 5 years are described for all the elements from H to Si, with special attention for the isotopes of hydrogen and C, N, O.

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页码：244 / 254

页数：11

相关论文

共 164 条

[1] USE OF THE O-16(HE-3,ALPHA)O-15 REACTION FOR STUDYING OXYGEN-CONTAINING THIN-FILMS [J].

ABEL, F ;

AMSEL, G ;

DARTEMARE, E ;

ORTEGA, C ;

SIEJKA, J ;

VIZKELETHY, G .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 45 (1-4) :100-104

[2]

ADLER PN, 1974, HYDROGEN METALS, P623

[3] ENERGY-LEVELS OF LIGHT-NUCLEI A= 13-15 [J].

AJZENBERGSELOVE, F .

NUCLEAR PHYSICS A, 1976, 268 (01) :1-204

[4] DEPTH PROFILING OF DEUTERIUM IMPLANTED INTO STAINLESS-STEEL AT ROOM-TEMPERATURE [J].

ALTSTETTER, CJ ;

BEHRISCH, R ;

BOTTIGER, J ;

POHL, F ;

SCHERZER, BMU .

NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :59-63

[5] ANALYSIS OF BORON PRE-DEPOSITED SILICON WAFERS BY COMBINED ION-BEAM TECHNIQUES AND X-RAY MICROANALYSIS [J].

ARMIGLIATO, A ;

BENTINI, GG ;

RUFFINI, G ;

BATTAGLIN, G ;

DELLAMEA, G ;

DRIGO, AV .

NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :653-658

[6] NITROGEN PROFILING IN NITRIDE FILMS AND NITROGEN-IMPLANTED SAMPLES USING THE N-14(ALPHA,ALPHA) AND N-14(ALPHA,P) REACTIONS AT 6 MEV INCIDENT ENERGY [J].

ARTIGALAS, H ;

CHEVARIER, A ;

CHEVARIER, N ;

ELBOUANANI, M ;

GERLIC, E ;

MONCOFFRE, N ;

ROUX, B ;

STERN, M ;

TOUSSET, J .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 66 (1-2) :237-241

[7] ANALYSIS OF NEON BY PARTICLE ACCELERATORS [J].

BANSELEFEBVRE, A ;

DECONNINCK, G ;

DUBUS, M ;

TERWAGNE, G .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 66 (1-2) :205-208

[8] MEASUREMENT OF THE OXYGEN-CONTENT IN HIGH-TC SUPERCONDUCTORS - ENHANCED RESONANT ION-SCATTERING ANALYSIS [J].

BARBOUR, JC ;

DOYLE, BL ;

MYERS, SM .

PHYSICAL REVIEW B, 1988, 38 (10) :7005-7008

[9]

BARBOUR JC, 1989, MICROBEAM ANAL, P196

[10]

BASHKIN S, 1951, PHYS REV, V84, P84

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