ANALYSIS OF NEON BY PARTICLE ACCELERATORS

被引：3

作者：

BANSELEFEBVRE, A ^{[1
]}

DECONNINCK, G ^{[1
]}

DUBUS, M ^{[1
]}

TERWAGNE, G ^{[1
]}

机构：

[1] CENG,GRENOBLE,FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1992年 / 66卷 / 1-2期

关键词：

D O I：

10.1016/0168-583X(92)96151-N

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Natural neon has three stable isotopes, Ne-20 (90.92%), Ne-21 (0,257%) and Ne-22 (8.8%) which can be detected by nuclear reactions. An experiment on the elastic scattering of 2 MeV He-4 ions from a solid neon target at 5.5 K is described, the spectrum is correctly fitted with a calculation using the Rutherford scattering cross section. Most applications are in the analysis of neon implanted metals. Depth profiling is possible by nuclear resonant reactions. A review is given of the main resonances used; in each case prompt gamma-rays are detected. In the analysis of Ne-20, the Ne-20(p, gamma)Na-21* reaction has a narrow resonance at 1168,8 keV which can be used with detection of annihilation gamma-rays from the beta+ decay of Na-21*. The Ne-22(p, gamma)Na-23* reaction has a resonance at 1005 keV yielding 2640 keV gamma-rays, the half-life (120 fs) is short enough to allow Doppler shift analysis. PIXE using solid state detectors has few applications but dispersive X-ray spectroscopy of neon shows wide broadening of X-rays lines. This phenomenon is observed in metals implanted with neon ions. It can be used for the estimation of the pressure inside the bubbles formed by implantation.

引用

页码：205 / 208

页数：4

共 13 条

[1]

[Anonymous], ELECTRONIC STRUCTURE

[2] HIGH-RESOLUTION DEPTH PROFILING OF F, NE AND NA IN MATERIALS [J].