COINCIDENCE COUNTING IN TIME-OF-FLIGHT MASS-SPECTROMETRY - A TEST FOR CHEMICAL MICROHOMOGENEITY

被引：63

作者：

PARK, MA ^{[1
]}

GIBSON, KA ^{[1
]}

QUINONES, L ^{[1
]}

SCHWEIKERT, EA ^{[1
]}

机构：

[1] TEXAS A&M UNIV SYST,CTR CHEM CHARACTERIZAT & ANAL,COLLEGE STN,TX 77843

来源：

SCIENCE | 1990年 / 248卷 / 4958期

关键词：

D O I：

10.1126/science.248.4958.988

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Coincidence counting techniques have been combined with time-of-flight mass spectrometry in the examination of surfaces for chemical microhomogeneity. A mathematical formalism was developed to describe the principles underlying this coincidence counting technique and was used to produce a quantitative method for handling the data obtained. This technique of testing for chemical homogeneity has been demonstrated with a sample that consists of a physical mixture of polystyrene and crystals of NaF which were tenths of micrometers in diameter. Ultimately this approach is expected to be useful for the routine testing of surfaces for chemical homogeneity at the level of tens of nanometers.

引用

页码：988 / 990

页数：3

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