MTF MEASUREMENT VIA DIFFRACTION SHEARING WITH OPTICALLY SUPERIMPOSED GRATINGS

被引：4

作者：

ARECCHI, FT

BASSAN, M

JACOBS, SF

MOLESINI, G

机构：

[1] Istituto Nazionale di Ottica, Firenze

来源：

APPLIED OPTICS | 1979年 / 18卷 / 08期

关键词：

D O I：

10.1364/AO.18.001247

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The use of double grating diffraction shearing for measurement of MTF is demonstrated.By superimposing two gratings optically we avoid the problem of grating contact and subsequent degradation.This simple and economical method is especially advantageous for optical systems with large pupil for which a rotating plate interferometer becomes prohibitively expensive.© 1979 Optical Society of America.

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页码：1247 / 1248

页数：2

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