OPTICAL CHARACTERIZATION OF ALGAN-GAN-ALGAN QUANTUM-WELLS

被引:18
作者
KRISHNANKUTTY, S [1 ]
KOLBAS, RM [1 ]
KHAN, MA [1 ]
KUZNIA, JN [1 ]
VANHOVE, JM [1 ]
OLSON, DT [1 ]
机构
[1] APA OPT INC,BLAINE,MN 55434
关键词
LPMOCVD; PHOTOLUMINESCENCE; TYPE-I HETEROJUNCTION; CRITICAL THICKNESS;
D O I
10.1007/BF02660408
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High quality AlxGa1-xN-AlxGa1-xN quantum wells of different thicknesses and x values were grown by low pressure metalorganic chemical vapor deposition (LPMOCVD). The change in their emission energies (measured at 77 K by photoluminescence) as a function of both well width and x value was typical of a type I heterojunction. The experimental data was compared to theoretical calculations based on the finite square well model and the confined particle transitions were identified. The experimentally observed energy shifts differed from calculated values of the n = 1 electron to heavy hole transition by a constant amount (for a given x value) attributed to strain in the AlGaN-GaN system. Also, an estimate of the critical thickness in the AlGaN-GaN system was determined based on the Matthews and Blakeslee force balance model.
引用
收藏
页码:437 / 440
页数:4
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