HIGH-RESOLUTION LIFETIME MAPPING USING MODULATED FREE-CARRIER ABSORPTION

被引：52

作者：

GLUNZ, SW

WARTA, W

机构：

[1] Fraunhofer-Institute for Solar Energy Systems (FhG-ISE), D-79100 Freiburg

来源：

JOURNAL OF APPLIED PHYSICS | 1995年 / 77卷 / 07期

关键词：

D O I：

10.1063/1.358677

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Modulated free-carrier absorption (MFCA) is introduced as a novel contactless lifetime mapping technique with high spatial resolution. The advantages of MFCA mapping as compared to other methods are discussed. Examples of lifetime maps on multicrystalline silicon are presented. Solar cells fabricated from identical wafers have been investigated using light beam induced current mapping. Excellent agreement between structures obtained in the measured lifetime and in the current maps was observed. In addition, a quantitative comparison with diffusion lengths determined by local internal quantum efficiency evaluations is presented. © 1995 American Institute of Physics.

引用

页码：3243 / 3247

页数：5

共 16 条

[1]

BASORE PA, 1993, 23RD P IEEE PHOT SPE

[2]

GILES FP, 1993, 23 IEEE PHOT SPEC C, P299

[3] INJECTION-LEVEL-DEPENDENT RECOMBINATION VELOCITIES AT THE SI-SIO2 INTERFACE FOR VARIOUS DOPANT CONCENTRATIONS [J].

GLUNZ, SW ;

SPROUL, AB ;

WARTA, W ;

WETTLING, W .

JOURNAL OF APPLIED PHYSICS, 1994, 75 (03) :1611-1615

[4]

HIRSCH M, IN PRESS SOLID STATE

[5]

Kane D.E., 1985, 18TH P IEEE PHOT SPE, P578

[6] METHOD FOR THE MEASUREMENT OF LONG MINORITY-CARRIER DIFFUSION LENGTHS EXCEEDING WAFER THICKNESS [J].

LAGOWSKI, J ;

KONTKIEWICZ, AM ;

JASTRZEBSKI, L ;

EDELMAN, P .

APPLIED PHYSICS LETTERS, 1993, 63 (21) :2902-2904

[7]

PALM J, 1993, J APPL PHYS, V74, P69

[8]

PAUL A, 1990, 21ST P IEEE PHOT SPE, P374

[9]

SANII F, 1989, 20TH P IEEE PHOT SPE, P575

[10]

STOKES ED, 1977, APPL PHYS LETT, V30, P625

← 1 2 →