NUCLEAR-SCATTERING MEASUREMENTS OF COMPOSITION PROFILES IN ALPHA-SI-H MULTILAYER STRUCTURES

被引：7

作者：

BRASSARD, C ^{[1
]}

GROLEAU, R ^{[1
]}

LECUYER, J ^{[1
]}

MARTIN, JP ^{[1
]}

CURRIE, JF ^{[1
]}

DEPELSENAIRE, P ^{[1
]}

WERTHEIMER, M ^{[1
]}

YELON, A ^{[1
]}

机构：

[1] ECOLE POLYTECH,DEPT GEN PHYS,MONTREAL H3C 3A7,QUEBEC,CANADA

来源：

JOURNAL DE PHYSIQUE | 1981年 / 42卷 / NC4期

关键词：

D O I：

10.1051/jphyscol:19814174

中图分类号：

学科分类号：

摘要：

引用

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页码：795 / 798

页数：4

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