PROFILING HYDROGEN IN MATERIALS USING ION-BEAMS

[1] ADLER PN, 1974, HYDROGEN METALS, P623

[2] ADLER PN, P TRI SERVICE CORROS, V2

[3] Andersen HH., 1977, HYDROGEN STOPPING PO

[4] BEHRISCH R, 1976, ION BEAM SURFACE LAY, P539

[5] Blewer R.S., 1976, ION BEAM SURFACE LAY, P185

[6] USING PROTON BACKSCATTERING METHOD OF LIGHT-ELEMENT PROFILING TO ACHIEVE TAILORED LOW-Z IMPURITY DISTRIBUTIONS IN SOLIDS [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 47 - 52

[7] DEPTH DISTRIBUTION OF IMPLANTED HELIUM AND OTHER LOW-Z ELEMENTS IN METAL-FILMS USING PROTON BACKSCATTERING [J]. APPLIED PHYSICS LETTERS, 1973, 23 (11) : 593 - 595

[8] PROTON BACKSCATTERING AS A TECHNIQUE FOR LIGHT ION SURFACE INTERACTION STUDIES IN CTR MATERIALS INVESTIGATIONS [J]. JOURNAL OF NUCLEAR MATERIALS, 1974, 53 (01) : 268 - 275

[9] BLEWER RS, C TECHNOLOGY CONTROL, V2, P525

[10] DEFECT STUDIES IN CRYSTALS BY MEANS OF CHANNELING [J]. CANADIAN JOURNAL OF PHYSICS, 1968, 46 (06) : 653 - &

[1] ADLER PN, 1974, HYDROGEN METALS, P623

[2] ADLER PN, P TRI SERVICE CORROS, V2

[3] Andersen HH., 1977, HYDROGEN STOPPING PO

[4] BEHRISCH R, 1976, ION BEAM SURFACE LAY, P539

[5] Blewer R.S., 1976, ION BEAM SURFACE LAY, P185

[6] USING PROTON BACKSCATTERING METHOD OF LIGHT-ELEMENT PROFILING TO ACHIEVE TAILORED LOW-Z IMPURITY DISTRIBUTIONS IN SOLIDS [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 47 - 52

[7] DEPTH DISTRIBUTION OF IMPLANTED HELIUM AND OTHER LOW-Z ELEMENTS IN METAL-FILMS USING PROTON BACKSCATTERING [J]. APPLIED PHYSICS LETTERS, 1973, 23 (11) : 593 - 595

[8] PROTON BACKSCATTERING AS A TECHNIQUE FOR LIGHT ION SURFACE INTERACTION STUDIES IN CTR MATERIALS INVESTIGATIONS [J]. JOURNAL OF NUCLEAR MATERIALS, 1974, 53 (01) : 268 - 275

[9] BLEWER RS, C TECHNOLOGY CONTROL, V2, P525

[10] DEFECT STUDIES IN CRYSTALS BY MEANS OF CHANNELING [J]. CANADIAN JOURNAL OF PHYSICS, 1968, 46 (06) : 653 - &