PROTON BACKSCATTERING AS A TECHNIQUE FOR LIGHT ION SURFACE INTERACTION STUDIES IN CTR MATERIALS INVESTIGATIONS

被引：23

作者：

BLEWER, RS ^{[1
]}

机构：

[1] SANDIA LABS,ALBUQUERQUE,NM 87115

来源：

JOURNAL OF NUCLEAR MATERIALS | 1974年 / 53卷 / 01期

关键词：

D O I：

10.1016/0022-3115(74)90255-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：268 / 275

页数：8

相关论文

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[2] DEPTH DISTRIBUTION OF IMPLANTED HELIUM AND OTHER LOW-Z ELEMENTS IN METAL-FILMS USING PROTON BACKSCATTERING
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[3] DIMENSIONAL EXPANSION AND SURFACE MICROSTRUCTURE IN HELIUM-IMPLANTED ERBIUM AND ERBIUM-HYDRIDE FILMS
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[9] RANGE AND ENERGY LOSS OF IMPLANTED IONS
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