X-RAY STRUCTURE DETERMINATION OF A NEW MISFIT LAYER COMPOUND - BISMUTH CHROMIUM SULFIDE

被引：13

作者：

LAFOND, A

FRAGNAUD, P

EVAIN, M

MEERSCHAUT, A

机构：

[1] I.M.N. Laboratoire de Chimie des Solides, 44072 Nantes Cedex

来源：

MATERIALS RESEARCH BULLETIN | 1992年 / 27卷 / 06期

关键词：

BISMUTH; CHROMIUM; SULFIDES;

D O I：

10.1016/0025-5408(92)90078-E

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

(BiS)1.24CrS2 is a new misfit layer phase in which two types of slabs, \BiS\ and \CrS2\, alternate along the stacking direction (c = 1098.5 pm). The misfit between the two slabs occurs along the a in-plane direction with the periodicities a1 = 558.24 pm and a2 = 347.05 pm, respectively. The a1/a2 ratio is irrational but close to 8/5. The second in-plane cell parameter (b = 590.0 pm) is common to both slabs. The \BiS\ slab arrangement is similar to a {001} slice (half an edge thick) of a NaCl-type fcc cell. The \CrS2\ slab is a sandwich with the Cr in trigonally distorted sulfur octahedra like in 1T-TiS2. Such a structure resembles that of (LaS)1.20CrS2.

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页码：705 / 713

页数：9

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