X-RAY CRYSTAL-STRUCTURE DETERMINATION OF THE TRICLINIC MISFIT LAYER COMPOUND (SNS)1.20TIS2

被引:41
作者
WIEGERS, GA
MEETSMA, A
DEBOER, JL
VANSMAALEN, S
HAANGE, RJ
机构
[1] Lab. of Inorg. Chem., Groningen Univ.
关键词
D O I
10.1088/0953-8984/3/16/001
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
(SnS)1.20TiS2 is a misfit layer compound built of alternately double layers of SnS with distorted rocksalt-type structure and sandwiches of TiS2 slightly distorted compared with those of 1T-TiS2. For comparison with other misfit layer compounds the triclinic subsystems are described in centred unit cells: for the SnS part, a1 = 5.683(1) angstrom, b1 = 5.832(1) angstrom, c1 = 11.680(5) angstrom, alpha-1 = 95.85(3)-degrees, beta-1 = 94.78(3)-degrees, gamma-1 = 90.03(2)-degrees, the space group is C1BAR and Z = 4; for the TiS2 part, a2 = 3.412(1) angstrom, b2 = 5.835(1) angstrom, c2 = 23.289(3) angstrom, alpha-2 = 95.86(1)-degrees, beta-2 = 90.30(1)-degrees, gamma-2 = 90.01(1)-degrees, the space group is F1BAR and Z = 4. In real space, a1 and a2 as well as b1 and b2 are parallel while the c axes diverge. In reciprocal space both sublattices have the (b*, c*) plane in common. Refinements were performed of the SnS part using 1351 independent reflections (R(F) = 0.087) and of the TiS2 part using 714 reflections (R(F) = 0.080). Each Sn atom is coordinated to five S atoms of the SnS double layer with SnS distances of 2.610(3), 2.866(4), 2.873(4), 2.911(4) and 2.976(4) angstrom, and at larger distances to S of TiS2. The Ti-S distances of the distorted TiS6 octahedra with symmetry 1BAR are 2.417(2), 2.429(1) and 2.428(1) angstrom. Sn atoms are between rows of sulphur along a of S of TiS2. The structural relationship with other misfit layer compounds is discussed.
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页码:2603 / 2612
页数:10
相关论文
共 24 条
[1]   STRUCTURE REFINEMENT OF STOICHIOMETRIC TIS2 [J].
CHIANELLI, RR ;
SCANLON, JC ;
THOMPSON, AH .
MATERIALS RESEARCH BULLETIN, 1975, 10 (12) :1379-1382
[2]   RELATIVISTIC CALCULATION OF ANOMALOUS SCATTERING FACTORS FOR X-RAYS [J].
CROMER, DT ;
LIBERMAN, D .
JOURNAL OF CHEMICAL PHYSICS, 1970, 53 (05) :1891-&
[3]   X-RAY SCATTERING FACTORS COMPUTED FROM NUMERICAL HARTREE-FOCK WAVE FUNCTIONS [J].
CROMER, DT ;
MANN, JB .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :321-&
[4]   DIFFRACTOMETER SOFTWARE (CAD4F) [J].
DEBOER, JL ;
DUISENBERG, AJM .
ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 :C410-C410
[5]   PREPARATION AND CHARACTERIZATION OF A NEW COMPOSITE-LAYERED SULFIDE, (PBS)1.12VS2, PBVS3 [J].
GOTOH, Y ;
GOTO, M ;
KAWAGUCHI, K ;
OOSAWA, Y .
MATERIALS RESEARCH BULLETIN, 1990, 25 (03) :307-314
[6]   STRUCTURAL DETERMINATION AND TRANSPORT-PROPERTIES OF A NEW PHASE WITH APPROXIMATE COMPOSITION SN1.2TI0.8S3 [J].
GRESSIER, P ;
MEERSCHAUT, A ;
ROUXEL, J .
MATERIALS RESEARCH BULLETIN, 1987, 22 (11) :1573-1580
[7]   CHARACTERIZATION OF NEW SNNBS3, PBNBS3, PBNB2S5, SNTIS3 AND SNTI2S5 COMPOUNDS [J].
GUEMAS, L ;
RABU, P ;
MEERSCHAUT, A ;
ROUXEL, J .
MATERIALS RESEARCH BULLETIN, 1988, 23 (07) :1061-1069
[8]  
Hahn T., 1983, INT TABLES CRYSTALLO, VA. D
[9]  
HALL SR, 1989, XTAL 2 2 USERS MANUA
[10]   STRUCTURE REFINEMENT OF COMPOSITE CRYSTALS IN MULTIDIMENSIONAL SPACE [J].
KATO, K .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1990, 46 :39-44