SIMPLE MONTE-CARLO METHOD FOR SIMULATING ELECTRON-SOLID INTERACTIONS AND ITS APPLICATION TO ELECTRON-PROBE MICROANALYSIS

被引：113

作者：

LOVE, G ^{[1
]}

COX, MGC ^{[1
]}

SCOTT, VD ^{[1
]}

机构：

[1] UNIV BATH, SCH MAT SCI, BATH BA2 7AY, SOMERSETSHIRE, ENGLAND

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1977年 / 10卷 / 01期

关键词：

D O I：

10.1088/0022-3727/10/1/002

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：7 / 23

页数：17

相关论文

共 34 条

[21] INVESTIGATION OF STRAGGLING EFFECT ON CHARACTERISTIC X-RAY-EMISSION IN THICK TARGETS
HENOC, J
MAURICE, F
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (13) : 1542 - 1550
[22] ASSESSMENT OF BISHOPS ABSORPTION CORRECTION MODEL IN ELECTRON-PROBE MICROANALYSIS
LOVE, G
COX, MGC
SCOTT, VD
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (01) : 7 - 13
[23] ASSESSMENT OF PHILIBERTS ABSORPTION CORRECTION MODELS IN ELECTRON-PROBE MICROANALYSIS
LOVE, G
COX, MGC
SCOTT, VD
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (14) : 1686 - 1702
[24] MONTE-CARLO CALCULATIONS OF MAGNETIC CONTRAST FROM CUBIC MATERIALS IN SCANNING ELECTRON-MICROSCOPE
NEWBURY, DE
YAKOWITZ, H
MYKLEBUST, RL
[J]. APPLIED PHYSICS LETTERS, 1973, 23 (08) : 488 - 490
[25] Philibert, 1963, XRAY OPTICS XRAY MIC, P379
[26] Philibert J., 1966, XRAY OPTICS MICROANA, P159
[27] X-RAY CONTINUUM FROM THICK ELEMENTAL TARGETS FOR 10-50-KEV ELECTRONS
RAOSAHIB, TS
WITTRY, DB
[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) : 5060 - 5068
[28] QUANTITATIVE-ANALYSIS OF VERY LIGHT ELEMENTS BY ELECTRON-PROBE MICROANALYZER
RUSTE, J
GANTOIS, M
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (07) : 872 - 890
[29] SCHMITZ U, 1969, XRAY OPTICS MICROANA, P104
[30] Shimizu R, 1966, XRAY OPTICS MICROANA

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